Electron beam driven reactions in a Transmission Electron Microscope
Mark H Rümmeli
Many in situ studies in transmission electron microscopes usually require specialized sample holders or complicated modifications to the microscope instrument itself. This is typically expensive and often time consuming in terms of measurements.
In this presentation I will show how the imaging electron beam driven can be used to drive reactions and electron beam engineering without the need for any additional holders or instrument modification. Techniques to fabricate and manipulate nano-materials will be presented. In addition, approaches to look at structure-property relationships of graphene devices, which, can be both fabricated and examined in-situ in a TEM will be shown.